Explaining Bias in Deep Face Recognition via Image Characteristics

Published in 2022 IEEE International Joint Conference on Biometrics (IJCB), 2022

Recommended citation: A. Atzori, G. Fenu, and M. Marras, 2022 IEEE International Joint Conference on Biometrics (IJCB), 2022 https://arxiv.org/abs/2208.11099